The ZONGLEN heat flow meter is compatible with various brands of optical testing equipment on the market, and can complete optical performance testing in high and low temperature environments. It is an essential component of optical testing equipment

Common non constant stress spectra and combined stresses include: step stress tests; Progressive stress test; High Acceleration Life Test (HALT) (equipment level); High Acceleration Stress Screening (HASS) (equipment level); High Acceleration Temperature and Humidity Stress Test (HAST) (Part Level).

As an important component of optical communication, optical modules are optoelectronic devices that realize the conversion of light and electricity during the transmission of optical signals.

The CP chip test that must be conducted before slicing, on the one hand, verifies whether the various parameters and functions of the IC meet the design requirements, and on the other hand, marks the IC with failed parameters or functions from it

With the rapid development of the IC industry, the accuracy and stability of testing are two major challenges, especially in mass production ATE testing.

The main purpose of IC testing is to distinguish qualified chips from unqualified chips, ensuring the quality and reliability of the product.

In the AECQ100 vehicle certification process, many experiments require room temperature or high/low temperature testing before and after.

The accelerated test model is derived from testing the key factors of a product under normal stress levels and one or more accelerated stress levels.